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| 1 | Yukinobu Sakata, Shun'ichi Kaneko, Yuji Takagi, Hirohito Okuda: Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition 38(11): 1847-1856 (2005) |
Selection of 1 from 1 records - Yukinobu Sakata has 3 coauthors
Last update 2012-09-10 CET by the DBLP Team —
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