Yoriyuki Sakamoto (Selection)

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1 Kazumi Hatayama, Mitsuji Ikeda, Masahiro Takakura, Satoshi Uchiyama, Yoriyuki Sakamoto: Application of a Design for Delay Testability Approach to High Speed Logic LSIs. Asian Test Symposium 1997: 112-115

Selection of 1 from 1 records - Yoriyuki Sakamoto has 4 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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