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Hagen Sämrow (Selection)

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6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHagen Sämrow, Claas Cornelius, Philipp Gorski, Andreas Tockhorn, Dirk Timmermann: Selective redundancy to improve reliability and to slow down delay degradation due to gate oxide breakdown. DDECS 2012: 12-15
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHagen Sämrow, Claas Cornelius, Philipp Gorski, Jakob Salzmann, Dirk Timmermann: Effiziente Simulation von Gateoxiddefekten auf Gatterebene mit Transistorlevel-Genauigkeit. MBMV 2012: 157-168
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHagen Sämrow, Claas Cornelius, Philipp Gorski, Jakob Salzmann, Andreas Tockhorn, Dirk Timmermann: Functional enhancements of TMR for power efficient and error resilient ASIC designs. DDECS 2011: 183-188
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAndreas Tockhorn, Claas Cornelius, Hagen Sämrow, Dirk Timmermann: Modeling temperature distribution in Networks-on-Chip using RC-circuits. DDECS 2010: 229-232
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHagen Sämrow, Claas Cornelius, Frank Sill, Andreas Tockhorn, Dirk Timmermann: Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown. SBCCI 2009
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLClaas Cornelius, Frank Sill, Hagen Sämrow, Jakob Salzmann, Dirk Timmermann, Diógenes Cecilio da Silva Jr.: Encountering gate oxide breakdown with shadow transistors to increase reliability. SBCCI 2008: 111-116

Selection of 6 from 6 records - Hagen Sämrow has 7 coauthors

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