Michal Rakowski (Selection)

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2 Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz: Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. DSD 2008: 729-734

1 Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A. Pleskacz, Michal Rakowski: Layout to Logic Defect Analysis for Hierarchical Test Generation. DDECS 2007: 35-40

Selection of 2 from 5 records - Michal Rakowski has 47 coauthors

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2		Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz: Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. DSD 2008: 729-734
1		Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A. Pleskacz, Michal Rakowski: Layout to Logic Defect Analysis for Hierarchical Test Generation. DDECS 2007: 35-40