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| 3 | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Design & Test of Computers 20(5): 58-66 (2003) | |
| 2 | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310 |
Selection of 2 from 7 records - Jun Qian has 17 coauthors
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