Ron Press (Selection)

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5 Ron Press, Jay Jahangiri: The Demand and Practical Approach for 100x Test Compression. VLSI-SoC 2006: 245-250

4 Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press: Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317

Selection of 2 from 6 records - Ron Press has 14 coauthors

5		Ron Press, Jay Jahangiri: The Demand and Practical Approach for 100x Test Compression. VLSI-SoC 2006: 245-250
4		Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press: Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317