K. Prasad (Selection)

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1 Hung Son Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang: Reliability studies of barrier layers for Cu/PAE low-k interconnects. Microelectronics Reliability 46(8): 1309-1314 (2006)

Selection of 1 from 1 records - K. Prasad has 6 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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