Osei Poku (Selection)

Ask others: ACM DL/Guide - - CSB - MetaPress - Google - Bing - Yahoo

1

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)

Selection of 1 from 4 records - Osei Poku has 10 coauthors