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Tuan Pham (Selection)

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2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMinh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill: Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. ITC 2002: 683-692

Selection of 1 from 10 records - Tuan Pham has 144 coauthors

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