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Philippe Perdu (Selection)

List of publications from the DBLP Bibliography Server - FAQ
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39Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely: Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability 48(8-9): 1333-1338 (2008)
36Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJulie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gerald Haller, Vincent Goubier: Generic simulator for faulty IC. Microelectronics Reliability 48(8-9): 1592-1596 (2008)
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdellatif Firiti, D. Faujour, Gerald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, Vincent Pouget, Dean Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLO. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)

Selection of 7 from 52 records - Philippe Perdu has 102 coauthors

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