Michael G. Pecht (Selection)

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7 Leon Lantz, Seongdeok Hwang, Michael G. Pecht: Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing. Microelectronics Reliability 42(8): 1163-1170 (2002)

Selection of 1 from 39 records - Michael G. Pecht has 55 coauthors

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