Sang Phill Park (Selection)

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4 Sang Phill Park, Kunhyuk Kang, Kaushik Roy: Reliability Implications of Bias-Temperature Instability in Digital ICs. IEEE Design & Test of Computers 26(6): 8-17 (2009)

3 Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731

2 Jaydeep P. Kulkarni, Keejong Kim, Sang Phill Park, Kaushik Roy: Process variation tolerant SRAM array for ultra low voltage applications. DAC 2008: 108-113

1 Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam: Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ICCAD 2007: 730-734

Selection of 4 from 4 records - Sang Phill Park has 6 coauthors

4		Sang Phill Park, Kunhyuk Kang, Kaushik Roy: Reliability Implications of Bias-Temperature Instability in Digital ICs. IEEE Design & Test of Computers 26(6): 8-17 (2009)
3		Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731
2		Jaydeep P. Kulkarni, Keejong Kim, Sang Phill Park, Kaushik Roy: Process variation tolerant SRAM array for ultra low voltage applications. DAC 2008: 108-113
1		Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam: Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ICCAD 2007: 730-734