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Jin-Kyu Park (Selection)

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3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLWon-Seok Lee, Keun-Ho Lee, Jin-Kyu Park, Tae-Kyung Kim, Young-Kwan Park, Jeong-Taek Kong: Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling. ISQED 2003: 373-376

Selection of 1 from 7 records - Jin-Kyu Park has 14 coauthors

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