Alessandro Paccagnella (Selection)

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1 S. Cimino, A. Cester, Alessandro Paccagnella, G. Ghidini: Ionising radiation effects on MOSFET drain current. Microelectronics Reliability 43(8): 1247-1251 (2003)

Selection of 1 from 20 records - Alessandro Paccagnella has 57 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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