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T. Osipowicz (Selection)

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1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Zmeck, J. C. H. Phang, A. Bettiol, T. Osipowicz, F. Watt, L. J. Balk, F.-J. Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess: Analysis of high-power devices using proton beam induced charge microscopy. Microelectronics Reliability 41(9-10): 1519-1524 (2001)

Selection of 1 from 1 records - T. Osipowicz has 9 coauthors

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