Steven Oostdijk (Selection)

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2 Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460

1 Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241

Selection of 2 from 4 records - Steven Oostdijk has 11 coauthors

2		Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460
1		Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241