Koichi Nose (Selection)

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6 Koichi Nose, Takayasu Sakurai: Power-conscious interconnect buffer optimization with improved modeling of driver MOSFET and Its implications to bulk and SOI CMOS technology. ISLPED 2002: 24-29

5 Masayuki Hirabayashi, Koichi Nose, Takayasu Sakurai: Design methodology and optimization strategy for dual-VTH scheme using commercially available tools. ISLPED 2001: 283-286

4 Koichi Nose, Takayasu Sakurai: Optimization of VDD and VTH for low-power and high speed applications. ASP-DAC 2000: 469-474

3 Koichi Nose, Soo-Ik Chae, Takayasu Sakurai: Voltage dependent gate capacitance and its impact in estimating power and delay of CMOS digital circuits with low supply voltage (poster session). ISLPED 2000: 228-230

2 Koichi Nose, Takayasu Sakurai: Analysis and future trend of short-circuit power. IEEE Trans. on CAD of Integrated Circuits and Systems 19(9): 1023-1030 (2000)

1 Koichi Nose, Takayasu Sakurai: Integrated Current Sensing Device for Micro IDDQ Test. Asian Test Symposium 1998: 323-326

Selection of 6 from 7 records - Koichi Nose has 19 coauthors

6		Koichi Nose, Takayasu Sakurai: Power-conscious interconnect buffer optimization with improved modeling of driver MOSFET and Its implications to bulk and SOI CMOS technology. ISLPED 2002: 24-29
5		Masayuki Hirabayashi, Koichi Nose, Takayasu Sakurai: Design methodology and optimization strategy for dual-VTH scheme using commercially available tools. ISLPED 2001: 283-286
4		Koichi Nose, Takayasu Sakurai: Optimization of VDD and VTH for low-power and high speed applications. ASP-DAC 2000: 469-474
3		Koichi Nose, Soo-Ik Chae, Takayasu Sakurai: Voltage dependent gate capacitance and its impact in estimating power and delay of CMOS digital circuits with low supply voltage (poster session). ISLPED 2000: 228-230
2		Koichi Nose, Takayasu Sakurai: Analysis and future trend of short-circuit power. IEEE Trans. on CAD of Integrated Circuits and Systems 19(9): 1023-1030 (2000)
1		Koichi Nose, Takayasu Sakurai: Integrated Current Sensing Device for Micro IDDQ Test. Asian Test Symposium 1998: 323-326