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Gregory A. Northrop (Selection)

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5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002)

Selection of 1 from 9 records - Gregory A. Northrop has 47 coauthors

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