Makoto Nohmi (Selection)

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2

Nobuyasu Kanekawa, Makoto Nohmi, Yoshimichi Satoh, Hiroshi Satoh: Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy. FTCS 1996: 426-430

Selection of 1 from 2 records - Makoto Nohmi has 6 coauthors