Bart Nauwelaers (Selection)

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6 Arun Chandrasekhar, Steven Brebels, Serguei Stoukatch, Eric Beyne, Walter De Raedt, Bart Nauwelaers: The influence of packaging materials on RF performance. Microelectronics Reliability 43(3): 351-357 (2003)

Selection of 1 from 18 records - Bart Nauwelaers has 36 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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