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Sani R. Nassif (Selection)

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116Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jerry Hayes, Sani R. Nassif: Yield estimation via multi-cones. DAC 2012: 1107-1112
110Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif: Accelerated statistical simulation via on-demand Hermite spline interpolations. ICCAD 2011: 353-360
102Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design 2011: (2011)
96Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives. ISLPED 2010: 337-342
91Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Chad Adams, James Warnock, Sani R. Nassif: An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects. ICCAD 2009: 497-504
89Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das: Yield estimation of SRAM circuits using "Virtual SRAM Fab". ICCAD 2009: 631-636
88Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka: Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED 2009: 190-194
87Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYing Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi: The impact of BEOL lithography effects on the SRAM cell performance and yield. ISQED 2009: 607-612
78Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Zhou Li, Jente B. Kuang, Hung C. Ngo, Ying Zhou, Weiping Shi, Sani R. Nassif: SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes. ISLPED 2008: 87-92
77Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Keunwoo Kim, Richard Williams, Sani R. Nassif: Statistical Evaluation of Split Gate Opportunities for Improved 8T/6T Column-Decoupled SRAM Cell Yield. ISQED 2008: 702-707
75Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Zhuo Li, Rajiv V. Joshi, Frank Liu, Sani R. Nassif: A Root-Finding Method for Assessing SRAM Stability. ISQED 2008: 804-809
67Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif: Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED 2007: 33-40
63Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events. DAC 2006: 69-72
57Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park, Rouwaida Kanj, Sani R. Nassif: System-Level SRAM Yield Enhancement. ISQED 2006: 179-184
56Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPraveen Elakkumanan, Jente B. Kuang, Kevin J. Nowka, Ramalingam Sridhar, Rouwaida Kanj, Sani R. Nassif: SRAM Local Bit Line Access Failure Analyses. ISQED 2006: 204-209

Selection of 15 from 117 records - Sani R. Nassif has 169 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page