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| 7 | S. Nakajima, S. Nakamura, K. Kuji, T. Ueki, T. Ajioka, T. Sakai: Construction of a cost-effective failure analysis service network--microelectronic failure analysis service in Japan. Microelectronics Reliability 42(4-5): 511-521 (2002) |
Selection of 1 from 9 records - S. Nakamura has 18 coauthors
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