Jayathi Murthy (Selection)

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5 Jung Hwan Choi, Jayathi Murthy, Kaushik Roy: The effect of process variation on device temperature in FinFET circuits. ICCAD 2007: 747-751

4 Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy: Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2059-2068 (2007)

3 Aditya Bansal, Mesut Meterelliyoz, Siddharth Singh, Jung Hwan Choi, Jayathi Murthy, Kaushik Roy: Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology. ASP-DAC 2006: 237-242

2 Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy: Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits. ICCAD 2006: 583-586

Selection of 4 from 5 records - Jayathi Murthy has 8 coauthors

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5		Jung Hwan Choi, Jayathi Murthy, Kaushik Roy: The effect of process variation on device temperature in FinFET circuits. ICCAD 2007: 747-751
4		Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy: Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2059-2068 (2007)
3		Aditya Bansal, Mesut Meterelliyoz, Siddharth Singh, Jung Hwan Choi, Jayathi Murthy, Kaushik Roy: Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology. ASP-DAC 2006: 237-242
2		Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy: Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits. ICCAD 2006: 583-586