Nilanjan Mukherjee (Selection)

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56 Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek: Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium 2011: 419-424

52 Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer: Ring Generator: An Ultimate Linear Feedback Shift Register. IEEE Computer 44(6): 64-71 (2011)

51 Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: BIST-Based Fault Diagnosis for Read-Only Memories. IEEE Trans. on CAD of Integrated Circuits and Systems 30(7): 1072-1085 (2011)

45 Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. IEEE Trans. on CAD of Integrated Circuits and Systems 29(3): 441-453 (2010)

43 Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Fault diagnosis for embedded read-only memories. ITC 2009: 1-10

41 Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High-Speed On-Chip Event Counters for Embedded Systems. VLSI Design 2009: 275-280

36 Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. ITC 2008: 1-10

Selection of 7 from 56 records - Nilanjan Mukherjee has 56 coauthors

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56		Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek: Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium 2011: 419-424
52		Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer: Ring Generator: An Ultimate Linear Feedback Shift Register. IEEE Computer 44(6): 64-71 (2011)
51		Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: BIST-Based Fault Diagnosis for Read-Only Memories. IEEE Trans. on CAD of Integrated Circuits and Systems 30(7): 1072-1085 (2011)
45		Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. IEEE Trans. on CAD of Integrated Circuits and Systems 29(3): 441-453 (2010)
43		Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Fault diagnosis for embedded read-only memories. ITC 2009: 1-10
41		Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High-Speed On-Chip Event Counters for Embedded Systems. VLSI Design 2009: 275-280
36		Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST. ITC 2008: 1-10