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| 1 | K. Mleczko, Z. Zawislak, A. W. Stadler, Andrzej Kolek, Andrzej Dziedzic, J. Cichosz: Evaluation of conductive-to-resistive layers interaction in thick-film resistors. Microelectronics Reliability 48(6): 881-885 (2008) |
Selection of 1 from 1 records - K. Mleczko has 5 coauthors
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