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Kohei Miyase (Selection)

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42Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen: Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510
40Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKohei Miyase, X. Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara: Transition-Time-Relation based capture-safety checking for at-speed scan test generation. DATE 2011: 895-898
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLX. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. European Test Symposium 2008: 55-60

Selection of 3 from 44 records - Kohei Miyase has 50 coauthors

Last update 2012-09-10 CET by the DBLP TeamThis material is Open Data Content released under the ODC-BY 1.0 license — See also our legal information page