Kohei Miyase (Selection)

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42 Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen: Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510

40 Kohei Miyase, X. Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara: Transition-Time-Relation based capture-safety checking for at-speed scan test generation. DATE 2011: 895-898

25 X. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. European Test Symposium 2008: 55-60

Selection of 3 from 44 records - Kohei Miyase has 50 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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42		Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen: Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510
40		Kohei Miyase, X. Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara: Transition-Time-Relation based capture-safety checking for at-speed scan test generation. DATE 2011: 895-898
25		X. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. European Test Symposium 2008: 55-60