| | |
- CSB - MetaPress - Google - Bing - Yahoo
Ask others: ACM DL/Guide - - CSB - MetaPress - Google - Bing - Yahoo
| 44 |       | Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara: A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. VTS 2012: 197-202 |
| 41 | | Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel: Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium 2011: 90-95 |
| 40 | | Kohei Miyase, X. Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara: Transition-Time-Relation based capture-safety checking for at-speed scan test generation. DATE 2011: 895-898 |
| 39 | | Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich: SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. ISLPED 2011: 33-38 |
| 38 | | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang: A novel scan segmentation design method for avoiding shift timing failure in scan testing. ITC 2011: 1-8 |
| 37 | | Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor: Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS 2011: 166-171 |
| 36 | | Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara: A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing. IEICE Transactions 94-D(4): 833-840 (2011) |
| 35 | | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. IEICE Transactions 94-D(6): 1216-1226 (2011) |
| 34 | | Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura: On estimation of NBTI-Induced delay degradation. European Test Symposium 2010: 107-111 |
| 32 | | Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Transactions 93-A(7): 1309-1318 (2010) |
| 31 | | Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor: High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Transactions 93-D(1): 2-9 (2010) |
| 30 | | Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa: CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Asian Test Symposium 2009: 99-104 |
| 29 | | Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara: A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. ICCAD 2009: 97-104 |
| 28 | | Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara: A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. PRDC 2009: 81-86 |
| 26 | | Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen: Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266 |
| 25 | | X. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. European Test Symposium 2008: 55-60 |
| 24 | | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58 |
| 22 | | Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara: A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. IEICE Transactions 91-D(3): 667-674 (2008) |
| 21 | | Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy: On Detection of Bridge Defects with Stuck-at Tests. IEICE Transactions 91-D(3): 683-689 (2008) |
| 20 | | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. J. Electronic Testing 24(4): 379-391 (2008) |
| 19 | | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532 |
| 18 | | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang: A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10 |
| 17 | | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions 90-D(9): 1398-1405 (2007) |
| 16 | | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006 |
| 15 | | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita: A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. VTS 2006: 58-65 |
| 14 | | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006) |
| 13 | | Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy: On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223 |
| 12 | | Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja: Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electronics 1(3): 319-330 (2005) |
| 11 | | Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy: Multiple Scan Tree Design with Test Vector Modification. Asian Test Symposium 2004: 76-81 |
| 10 | | Kohei Miyase, Seiji Kajihara: XID: Don't care identification of test patterns for combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 23(2): 321-326 (2004) |
| 9 | | Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy: Don't Care Identification and Statistical Encoding for Test Data Compression. IEICE Transactions 87-D(3): 544-550 (2004) |
| 8 | | Kohei Miyase, Seiji Kajihara: Optimal Scan Tree Construction with Test Vector Modification for Test Compression. Asian Test Symposium 2003: 136-141 |
| 7 | | Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz: On test data volume reduction for multiple scan chain designs. ACM Trans. Design Autom. Electr. Syst. 8(4): 460-469 (2003) |
| 6 | | Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy: Test Data Compression Using Don?t-Care Identification and Statistical Encoding. Asian Test Symposium 2002: 67- |
| 5 | | Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy: A Method of Static Test Compaction Based on Don't Care Identification. DELTA 2002: 392-395 |
| 4 | | Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy: Don't-Care Identification on Specific Bits of Test Patterns. ICCD 2002: 194-199 |
| 3 | | Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz: On Test Data Volume Reduction for Multiple Scan Chain Designs. VTS 2002: 103-110 |
| 2 | | Seiji Kajihara, Koji Ishida, Kohei Miyase: Test Vector Modification for Power Reduction during Scan Testing. VTS 2002: 160-165 |
| 1 | | Seiji Kajihara, Kohei Miyase: On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits. ICCAD 2001: 364-369 |
Selection of 39 from 44 records - Kohei Miyase has 50 coauthors
Last update 2012-09-10 CET by the DBLP Team —
Content released under the ODC-BY 1.0 license — See also our legal information page