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| 11 |       | P. Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, J. P. Fradin: Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectronics Reliability 47(9-11): 1343-1348 (2007) |
| 7 | | Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet: A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectronics Reliability 47(9-11): 1713-1718 (2007) |
| 6 | | J. Urresti-Ibañez, Alberto Castellazzi, M. Piton, J. Rebollo, Michel Mermet-Guyennet, Mauro Ciappa: Robustness test and failure analysis of IGBT modules during turn-off. Microelectronics Reliability 47(9-11): 1725-1729 (2007) |
| 4 | | X. Perpiñà, Alberto Castellazzi, M. Piton, Michel Mermet-Guyennet, José Millán: Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities. Microelectronics Reliability 47(9-11): 1784-1789 (2007) |
| 3 | | Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet: Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectronics Reliability 46(9-11): 1754-1759 (2006) |
| 2 | | D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner: New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability 46(9-11): 1772-1777 (2006) |
Selection of 6 from 14 records - Michel Mermet-Guyennet has 28 coauthors
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