Michel Mermet-Guyennet (Selection)

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8 D. Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner: Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectronics Reliability 47(9-11): 1707-1712 (2007)

2 D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner: New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability 46(9-11): 1772-1777 (2006)

1 X. Perpiñà, J. F. Serviere, J. Saiz, D. Barlini, Michel Mermet-Guyennet, José Millán: Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. Microelectronics Reliability 46(9-11): 1834-1839 (2006)

Selection of 3 from 14 records - Michel Mermet-Guyennet has 28 coauthors

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8		D. Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner: Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectronics Reliability 47(9-11): 1707-1712 (2007)
2		D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner: New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability 46(9-11): 1772-1777 (2006)
1		X. Perpiñà, J. F. Serviere, J. Saiz, D. Barlini, Michel Mermet-Guyennet, José Millán: Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. Microelectronics Reliability 46(9-11): 1834-1839 (2006)