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| 2 | Gunnar Diestel, Andreas Martin, Martin Kerber, Alfred Schlemm, Horst Erlenmaier, Bernhard Murr, Andreas Preussger: Quality assessment of thin oxides using constant and ramped stress measurements. Microelectronics Reliability 41(7): 1019-1022 (2001) |
Selection of 1 from 11 records - Andreas Martin has 22 coauthors
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