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Karen Maex (Selection)

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11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLY.-L. Li, Zs. Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)

Selection of 1 from 16 records - Karen Maex has 31 coauthors

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