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| 5 | F. Palumbo, G. Condorelli, Salvatore Lombardo, K. L. Pey, C. H. Tung, L. J. Tang: Structure of the oxide damage under progressive breakdown. Microelectronics Reliability 45(5-6): 845-848 (2005) |
Selection of 1 from 11 records - Salvatore Lombardo has 49 coauthors
Last update 2012-09-10 CET by the DBLP Team —
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