Robert Lisanke (Selection)

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1 Robert Lisanke, Franc Brglez, Aart J. de Geus, David Gregory: Testability-Driven Random Test-Pattern Generation. IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 1082-1087 (1987)

Selection of 1 from 1 records - Robert Lisanke has 3 coauthors

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