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Chen Li (Selection)

Irvine, CA, USA

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36Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChen Li, Cetin Cetinkaya: Frequency domain thickness measurement approach for microscale multilayered structures. IEEE T. Instrumentation and Measurement 55(1): 206-211 (2006)

Selection of 1 from 123 records - Chen Li has 212 coauthors

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