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Dean Lewis (Selection)

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41Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis: Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectronics Reliability 51(9-11): 1640-1645 (2011)
39Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGuillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet: LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectronics Reliability 51(9-11): 1662-1667 (2011)
38Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLF. Infante, Philippe Perdu, H. B. Kor, C. L. Gan, Dean Lewis: Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectronics Reliability 51(9-11): 1684-1688 (2011)
37Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLA. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis: CADless laser assisted methodologies for failure analysis and device reliability. Microelectronics Reliability 50(9-11): 1236-1240 (2010)
36Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGuillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet: Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectronics Reliability 50(9-11): 1499-1505 (2010)
35Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLF. Infante, Philippe Perdu, Dean Lewis: Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. Microelectronics Reliability 50(9-11): 1700-1705 (2010)
33Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLF. Infante, Philippe Perdu, Dean Lewis: Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectronics Reliability 49(9-11): 1169-1174 (2009)
29Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely: Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability 48(8-9): 1333-1338 (2008)
28Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, O. Crépel, Dean Lewis: Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectronics Reliability 48(8-9): 1529-1532 (2008)
27Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJulie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gerald Haller, Vincent Goubier: Generic simulator for faulty IC. Microelectronics Reliability 48(8-9): 1592-1596 (2008)
26Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJulie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis: Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
24Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLF. Essely, F. Darracq, Vincent Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, André Touboul, Dean Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLN. Guitard, F. Essely, D. Trémouilles, M. Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdellatif Firiti, D. Faujour, Gerald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, D. Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, Vincent Pouget, Dean Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLO. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDean Lewis, Vincent Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, Dean Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRomain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, Dean Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, Dean Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)

Selection of 31 from 41 records - Dean Lewis has 79 coauthors

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