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Dean Lewis (Selection)

List of publications from the DBLP Bibliography Server - FAQ
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17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, D. Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDean Lewis, Vincent Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)

Selection of 5 from 41 records - Dean Lewis has 79 coauthors

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