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M. Leicht (Selection)

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1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Leicht, G. Fritzer, B. Basnar, S. Golka, Jürgen Smoliner: A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices. Microelectronics Reliability 41(9-10): 1535-1537 (2001)

Selection of 1 from 2 records - M. Leicht has 8 coauthors

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