Mary Yvonne Lanzerotti (Selection)

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6 Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Impact of interconnect length changes on effective materials properties (dielectric constant). SLIP 2007: 73-80

5 Gerald G. Lopez, Giovanni Fiorenza, Thomas J. Bucelot, Phillip Restle, Mary Yvonne Lanzerotti: Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution. ACM Great Lakes Symposium on VLSI 2005: 38-43

4 Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry. SLIP 2005: 43-50

3 Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements. IBM Journal of Research and Development 49(4-5): 777-803 (2005)

2 Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Assessment of on-chip wire-length distribution models. IEEE Trans. VLSI Syst. 12(10): 1108-1112 (2004)

1 Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models. IEEE Trans. VLSI Syst. 12(12): 1330-1347 (2004)

Selection of 6 from 6 records - Mary Yvonne Lanzerotti has 5 coauthors

6		Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Impact of interconnect length changes on effective materials properties (dielectric constant). SLIP 2007: 73-80
5		Gerald G. Lopez, Giovanni Fiorenza, Thomas J. Bucelot, Phillip Restle, Mary Yvonne Lanzerotti: Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution. ACM Great Lakes Symposium on VLSI 2005: 38-43
4		Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry. SLIP 2005: 43-50
3		Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements. IBM Journal of Research and Development 49(4-5): 777-803 (2005)
2		Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Assessment of on-chip wire-length distribution models. IEEE Trans. VLSI Syst. 12(10): 1108-1112 (2004)
1		Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand: Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models. IEEE Trans. VLSI Syst. 12(12): 1330-1347 (2004)