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- CSB - MetaPress - Google - Bing - Yahoo
Ask others: ACM DL/Guide - - CSB - MetaPress - Google - Bing - Yahoo
| 2 |       | Mark Land, John J. SIDorowich, Richard K. Belew: Using Genetic Algorithms with Local Search for Thin Film Metrology. ICGA 1997: 537-544 |
Selection of 1 from 2 records - Mark Land has 2 coauthors
Copyright © 2010-01-01 by Michael Ley (ley@uni-trier.de)