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Yue Kuo (Selection)

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6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTao Yuan, Yue Kuo: Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices. IEEE Transactions on Reliability 59(1): 132-138 (2010)

Selection of 1 from 6 records - Yue Kuo has 34 coauthors

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