Srikanth Krishnan (Selection)

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1 Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan: Impact of negative bias temperature instability on digital circuit reliability. Microelectronics Reliability 45(1): 31-38 (2005)

Selection of 1 from 2 records - Srikanth Krishnan has 12 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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