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A. Krishnamoorthy (Selection)

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8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. F. Tsang, C. K. Chang, A. Krishnamoorthy, K. Y. Ee, Y. J. Su, H. Y. Li, W. H. Li, L. Y. Wong: A study of post-etch wet clean on electrical and reliability performance of Cu/low k interconnections. Microelectronics Reliability 45(3-4): 517-525 (2005)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. F. Tsang, C. Y. Li, A. Krishnamoorthy, Y. J. Su, H. Y. Li, L. Y. Wong, W. H. Li, L. J. Tang, K. Y. Ee: Impact of barrier deposition process on electrical and reliability performance of Cu/CVD low k SiOCH metallization. Microelectronics Journal 35(9): 693-700 (2004)

Selection of 2 from 23 records - A. Krishnamoorthy has 44 coauthors

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