M. Kouda (Selection)

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1 Kuniyuki Kakushima, K. Okamoto, T. Koyanagi, M. Kouda, Kiichi Tachi, T. Kawanago, J. Song, Parhat Ahmet, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai: SrO capping effect for La₂O₃/Ce-silicate gate dielectrics. Microelectronics Reliability 50(3): 356-359 (2010)

Selection of 1 from 1 records - M. Kouda has 12 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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