Peter deBruyn Kops (Selection)

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1 Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks: Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547

Selection of 1 from 1 records - Peter deBruyn Kops has 7 coauthors

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