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| 1 | F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh: Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. ISQED 2003: 119-124 |
Selection of 1 from 1 records - O. Kobozeva has 4 coauthors
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