J. Kim (Selection)

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25 Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka: Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED 2009: 190-194

Selection of 1 from 28 records - J. Kim has 133 coauthors

Last update 2012-09-10 CET by the DBLP Team —

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