Hyunjin Kim (Selection)

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2 Jongchul Shin, Hyunjin Kim, Sungho Kang: At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. DATE 1999: 473-

1 Hyunjin Kim, Jongchul Shin, Sungho Kang: An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329

Selection of 2 from 6 records - Hyunjin Kim has 9 coauthors

2		Jongchul Shin, Hyunjin Kim, Sungho Kang: At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. DATE 1999: 473-
1		Hyunjin Kim, Jongchul Shin, Sungho Kang: An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329