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Byungwhan Kim (Selection)

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9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLByungwhan Kim, Hee Ju Kwon, Seongjin Choi: Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36(3): 6570-6573 (2009)

Selection of 1 from 14 records - Byungwhan Kim has 17 coauthors

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