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| 1 |       | Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir: Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171 |
Selection of 1 from 1 records - Rabeb Kheriji has 3 coauthors
Copyright © 2010-01-06 by Michael Ley (ley@uni-trier.de)