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K. Ketata (Selection)

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7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. A. Belaïd, K. Ketata, K. Mourgues, M. Gares, M. Masmoudi, J. Marcon: Reliability study of power RF LDMOS device under thermal stress. Microelectronics Journal 38(2): 164-170 (2007)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. A. Belaïd, K. Ketata, M. Gares, K. Mourgues, M. Masmoudi, J. Marcon: Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectronics Reliability 47(1): 59-64 (2007)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. A. Belaïd, K. Ketata, M. Masmoudi, M. Gares, H. Maanane, J. Marcon: Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests. Microelectronics Reliability 46(9-11): 1800-1805 (2006)

Selection of 3 from 7 records - K. Ketata has 11 coauthors

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